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Computational
Mechanics
LABORATORY (CML) |
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| 723 West Michigan Street, SL 138
Indianapolis, IN 46202-5132 |
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When the electronic device is on, the packages warm up and they cool down when the device is off. These on/off cycles induce cyclic stresses and strains on the packages. Since the solder joints are the least stiff and the most compliant of all the materials used in the packages, they fail first. For a reliable prediction of the solder fatigue life due to the heating from the resistor, a reasonable temperature field must be determined. This is hard to achieve with experimental readings, since temperature cannot be read at all locations. |
Research at the CAD/CAM
Laboratory includes the Heat Transfer analyses to determine the temperature
fields in the packages. The calculated temperature fields are then used
as loadings for the stress analyses and the fatigue lives are calculated
based on the results of stress analyses.
Below is the temperature distribution
in the vicinity of a resistor. One quarter of the resistor is modeled due
to the assumed symmetry conditions.
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